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2018物理前沿学术报告第二十一讲:Aberration-corrected Transmission Electron Microscope: How it works and why we need it

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  • 发布时间:2018-08-21
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报告题目:Aberration-corrected Transmission Electron Microscope: How it works and why we need it

报告人:Associate Professor, Research Director  Zongwen Liu

工作单位:School of Chemical and Biomolecular Engineering, The University of Sydney

时间:8月22日(周三)下午14:30-16:00

地点:图书馆报告厅

内容简介:

Aberration limits the resolution of a transmission electron microscope (TEM). More than a half of a century ago, it was already proposed that aberration could be corrected to lift resolution, but real advances on aberration correction were only happened in the recent 20 years. In this lecturer, the basic principles on aberration collection will be first introduced, followed on by research examples achieved with modern aberration-corrected TEMs.

个人简介:

Current Appointment:Associate Professor, Research Director,School ofSchool of Chemical and Biomolecular Engineering, The University of Sydney

Qualifications:PhD  PhD 1999, Electron Microscopy, The University of  Melbourne

Previous Employment:2004-2011: Senor Research Fellow, QEII Fellow, Principle Research Fellow, Sydney Univ;2001-2004: STA Fellow, Senior Researcher, NIMS, Japan;1999-2001: Postdoctoral Fellow, The University of Queensland

Editorial duties:Editorial board member for journals of Functional Materials Letters, Journal of Nanotechnology Open Access, Open Material Sciences; Co-editor, Journal of OAtube Nanotechnology

Awards:Queen Elizabeth II Fellow (QEII), Science and Technology Agency (STA) Fellow; Japan Society for the Promotion of Science (JSPS) Fellow

Career Publications:Peer reviewed journal articles: 168  (over 5500 citations, H-index = 38)

Research interest:HRTEM, 3D microscopy, Nanotechnology, Quantum-dot solar cells, Li-based batteries, Super capacitors, High entropy alloys, Membranes for gas separation and water treatment

 

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